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Princeton University Library Catalog
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Silicon microelectronics programs at the National Institute of Standards and Technology : programs, activities, and accomplishments / edited by Joaquin V. Martinez de Pinillos, Stephen Knight, and Alice Settle-Raskin.
Format
Book
Language
English
Published/Created
[Gaithersburg, MD.] : U.S. Dept. of Commerce, National Institute of Standards and Technology, Technology Administration, 2000.
Description
viii, 151 pages : illustrations ; 28 cm
Availability
Copies in the Library
Location
Call Number
Status
Location Service
Notes
Lewis Library - Microforms
C 13.58:6522
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Details
Subject(s)
National Semiconductor Metrology Program (U.S.)
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Semiconductors
—
Measurement
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Related name
Pinillos, Joaquin V. Martinez de.
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Knight, Stephen
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Settle-Raskin, Alice
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National Institute of Standards and Technology (U.S.)
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Notes
"June 2000."
"NISTIR 6522."
Bibliographic references
Includes bibliographical references.
Reproduction note
Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [2000]. 2 microfiches : negative.
SuDoc no.
C 13.58:6522
Tech. report no.
NISTIR 6522
LCCN
00327427
OCLC
45887048
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